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08-Oct-2020 19:27

This sample is ground down to about 30 micrometers thick and mounted on a petrographic slide.The hydration rind is then measured under a high-power microscope outfitted with some method for measuring distance, typically in tenths of micrometers.In fact, the saturation layer on the surface forms up to a certain depth depending on factors that include the kinetics of the diffusion mechanism for the water molecules, the specific chemical structure of obsidian, as well as the external conditions affecting diffusion (temperature, relative humidity, and pressure).Together these factors result in the formation of an approximately constant, boundary concentration value, in the external surface layer.

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An approach to OHD with a completely new rationale suggests that refinement of the technique is possible in a manner which improves both its accuracy and precision and potentially expands the utility by generating reliable chronological data. presented a model which relied solely on compositionally-dependent diffusion, following numerical solutions (finite difference (FD), or finite element) elaborating on the H profile acquired by SIMS.Over time, water slowly diffuses into the artifact forming a narrow "band," "rim," or "rind" that can be seen and measured with many different techniques such as a high-power microscope with 40-80 power magnification b) depth profiling with SIMS (secondary ion mass spectrometry), and IR-PAS (infra red photoacoustic spectroscopy).